Description - Specimen Preparation for Transmission Electron Microscopy of Materials by PJ Goodhew
In this handbook the requirements of a specimen for both imaging and analysis are discussed first. The methods by which sheets of disc specimens can be prepared and final thinning techniques (electropolishing and ion beam thinning) are described with particular reference to the practical problems which are likely to be encountered. The procedures for the preparation of replicas (mainly extraction) and the methods of mounting specimens in the transmission electron microscope are described. The handbook also guides the reader to the most appropriate choice of specimen preparation method and gives practical hints on how to recognise and avoid artefacts which may arise.
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